Volume 38 Issue 2
Feb.  2012
Turn off MathJax
Article Contents
Lin Fengchun, Wang Qiancheng, Chen Yunxia, et al. Pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, (2): 233-238. (in Chinese)
Citation: Lin Fengchun, Wang Qiancheng, Chen Yunxia, et al. Pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, (2): 233-238. (in Chinese)

Pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing

  • Received Date: 25 Oct 2010
  • Publish Date: 29 Feb 2012
  • A pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing was proposed, according to mechanism consistency condition for lifetime random variables. Based on the pseudo life estimates, an F statistic was established to test the homogeneity of degradation mechanism characteristic parameters, where the characteristic parameter is logarithm standard deviation for log-normal distribution and shape parameter for Weibull distribution. And the exact rejection region was given. Using the F statistic, mechanism consistency test was done level by level from lower to higher, until the consistency condition was unsatisfied or the pseudo life estimates at all levels had been analyzed. Then, the stress level of mechanism consistency boundary was determined. This method can make good use of the transverse information from the degradation mechanism consistency between different accelerated stress levels, and effectively increase test precision. It has been used to determine the thermal degradation mechanism consistency boundary temperature for a coating flat glass, and the results show the rationality and validity of the presented method.

     

  • loading
  • [1]
    Wu S J,Shao J.Reliability analysis using the least squares method in nonlinear mixed-effect degradation models[J].Statistica Sinica,1999,9(3):855-877
    [2]
    Liao H T,Elsayed E A.Reliability prediction and testing plan based on an accelerated degradation rate model[J].International Journal of Materials and Product Technology,2004,21(5):402-422
    [3]
    Liao H,Elsayed E A.Reliability inference for field conditions from accelerated degradation testing[J].Naval Research Logistics,2006,53(6):576-587
    [4]
    Park J I,Bae S J.Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests[J].IEEE Transactions on Reliablity,2010,59(1):74-90
    [5]
    赵建印,刘芳.加速退化失效产品可靠性评估方法[J].哈尔滨工业大学学报,2008,40(10):1669-1671 Zhao Jianyin,Liu Fang.Reliability assessment from accelerated performance degradation tests[J].Journal of Harbin Institute of Technology,2008,40(10):1669-1671(in Chinese)
    [6]
    Hu J M,Baker D B,Dasgupta A,et al.Role of failure-mechanism identification in accelerated testing[J].Journal of the IES,1993,26(4):39-45
    [7]
    McLean H W.HALT,HASS,and HASA explained:accelerated reliability techniques [M].Revised Edition.Milwaukee:American Society for Quality,Quality Press,2009
    [8]
    茆诗松,王玲玲.加速寿命试验[M].北京:科学出版社,2000:85,139 Mao Shisong,Wang Lingling.Accelerated life testing[M].Beijing:Science Press,2000:85,139(in Chinese)
    [9]
    赵宇,杨军,马小兵.可靠性数据分析教程[M].北京:北京航空航天大学出版社,2009:184-188 Zhao Yu,Yang Jun,Ma Xiaobing.Reliability data analysis tutorial[M].Beijing:Beijing University of Aeronautics and Astronautics Press,2009:184-188 (in Chinese)
    [10]
    周源泉,翁朝曦,叶喜涛.论加速系数与失效机理不变的条件(I)——寿命型随机变量的情况[J].系统工程与电子技术,1996,18(1):55-67 Zhou Yuanquan,Weng Zhaoxi,Ye Xitao.Study on accelerated factor and condition for constant failure mechanism (I)—the case for lifetime is a random variable[J].Journal of Systems Engineering and Electronics,1996,18(1):55-67(in Chinese)
    [11]
    孙祝岭.失效机理不变的假设检验[J].电子产品可靠性与环境试验,2009,27(2):1-5 Sun Zhuling.Hypothesis testing for constant failure mechanism[J].Electronic Product Reliability and Environmental Testing,2009,27(2):1-5(in Chinese)
    [12]
    戴树森,费鹤良,王玲玲,等.可靠性试验及其统计分析:上册[M].北京:国防工业出版社,1983:536-539 Dai Shusen,Fei Heliang,Wang Lingling,et al.Reliability testing and its statistical analysis:vol.1[M].Beijing:National Defense Industry Press,1983:536-539(in Chinese)
    [13]
    中国电子技术标准化研究所.可靠性试验用表[M].北京:国防工业出版社,1987 The Chinese Research Institute for Electron Technology.Handbook of table for reliability testing[M].Beijing:National Defense Industry Press,1987(in Chinese)
    [14]
    周源泉,翁朝曦.可靠性评定[M].北京:科学出版社,1990:12-13 Zhou Yuanquan,Weng Zhaoxi.Reliability assessment[M].Beijing:Science Press,1990:12-13(in Chinese)
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views(3485) PDF downloads(584) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return