| Citation: | Pan Xiaoxi, Kang Rui. Identification method of failure mechanism consistency for accelerated testing based on grey forecasting[J]. Journal of Beijing University of Aeronautics and Astronautics, 2013, (6): 787-791,797. (in Chinese)
|
| [1] |
Pan Xiaoxi,Huang Xiaokai,Chen Yunxia,et al.Connotation of failure mechanism consistency and identification method for accelerated testing[C]//PHM-2011 Shenzhen Conference.Shenzhen: IEEE Computer Society,2011: 1-7
|
| [2] |
Hu J M,Barker D,Dasgupta A,et al.Role of failure-mechanism identification in accelerated testing[J].Institute of Environmental Sciences & Technology,1993,36(4):39-45
|
| [3] |
郭春生,谢雪松,马卫东,等.加速试验中失效机理一致性的判别方法[J].半导体学报,2006,27(3):560-563
Guo Chunsheng,Xie Xuesong,Ma Weidong,et al.A failure-mechanism identification method in accelerated testing[J].Chinese Journal of Semiconductors,2006,27(3):560-563(in Chinese) |
| [4] |
Cui Helen.Accelerated temperature cycle test and coffin-manson model for electronic packaging[C]//Reliability and Maintainability Symposium,Proceedings Annual.Alexandria,VA,United States: Institute of Electrical and Electronics Engineers Inc,2005:556-560
|
| [5] |
张春华.步降应力加速寿命试验的理论和方法[D].长沙:国防科学技术大学研究生院,2002
Zhang Chunhua.Theory and method of step-down-stress accelerated life testing[D].Changsha: National University of Defense Technology,2002(in Chinese) |
| [6] |
周源泉,翁朝曦,叶喜涛．论加速系数与失效机理的不变的条件(I)——寿命型随机变的情况[J]．系统工程与电子技术,1996(1):55-67
Zhou Yuanquan,Weng Zhaoxi,Ye Xitao.Study on accelerated factor and condition for constant failure mechanism(I)—the case for lifetime is a random variable[J].Systems Engineering and Electronics,1996(1):55-67(in Chinese) |
| [7] |
周源泉,翁朝曦,叶喜涛．论加速系数与失效机理的不变的条件(II)——失效为计数过程的情况[J]．系统工程与电子技术,1996(3):68-75
Zhou Yuanquan,Weng Zhaoxi,Ye Xitao.Study on accelerated factor and condition for constant failure mechanism(II)—the case for failure follows counting process [J].Systems Engineering and Electronics,1996(3):68-75(in Chinese) |
| [8] |
孙祝岭.失效机理不变的一个条件[J].电子产品可靠性与环境试验,2008,26(4):6-8
Sun Zhuling.A condition for constant failure mechanism[J].Electronic Product Reliability and Environmental Testing,2008,26(4):6-8(in Chinese)[9] 孙祝岭.失效机理不变的假设检验[J].电子产品可靠性与环境试验,2009,27(2):1-5 Sun Zhuling.Hypothesis testing for constant failure mechanism[J].Electronic Product Reliability and Environmental Testing,2009,27(2):1-5(in Chinese) |
| [9] |
吴鸿兵,林震.某电容器加速贮存寿命试验设计研究[J].环境适应性和可靠性,2007(5):17-21
Wu Hongbing,Lin Zhen.Design research of certain capacitor accelerated storage life testing[J].Environmental Apartability& Reliability,2007(5):17-21(in Chinese) |
| [10] |
朱立群,李敏伟,刘慧丛,等.高强度钢表面镀锌、镉层加速腐蚀试验研究[J].航空学报,2006,27(2):341-346
Zhu Liqun,Li Minwei,Liu Huicong,et al.Research of accelerated corrosion test of zinc,cadmium coating on high strength steel[J].Acta Aeronautica et Astronautica Sinica,2006,27(2):341-346(in Chinese) |
| [11] |
Kim Jungwoo,Yoon Dongcheol,Jeon Minseok,et al.Degradation behaviors and failure analysis of Ni-BaTiO3 base-metal electrode multilayer ceramic capacitors under highly accelerated life test[J].Current Applied Physics,2010,10(5):1297-1301
|
| [12] |
Deng Julong.Control problems of grey systems [J].Systems & Control Letters,1982,1(5):288-294
|
| [13] |
邓聚龙.灰色系统基本方法[M].2版.武汉:华中科技大学出版社,2005:2-4
Deng Julong.The primary methods of grey system theory[M].2nd ed.Wuhan:Huazhong University of Science and Technology Press,2005:2-4(in Chinese) |
| [14] |
刘思峰,党耀国,方志耕.灰色系统理论及其应用[M].北京:科学出版社,2004
Liu Sifeng,Dang Yaoguo,Fang Zhigeng.Theory and application of grey system theory[M].Beijing:Science Press,2004(in Chinese) |
| [15] |
李小燕.基于灰色理论的电力负荷预测[D].武汉:华中科技大学,2007
Li Xiaoyan.Electric power load forecasting based on grey theory[D].Wuhan:Huazhong University of Science and Technology,2007(in Chinese) |
Copyright © Journal of Beijing University of Aeronautics and Astronautics
Address: Editorial Department of Journal of Beijing University of Aeronautics and Astronautics, 37 Xueyuan Road, Haidian District, Beijing Post Code: 100191 Email: jbuaa@buaa.edu.cn
Supported by:
Beijing Renhe Information Technology Co., Ltd.
DownLoad: