Citation: | Meng Xiaofeng, Wang Guohua, Ji Honget al. Comprehensive TPS diagnostic capability assessment methodology based on Dempster-Shafer evidence theory[J]. Journal of Beijing University of Aeronautics and Astronautics, 2006, 32(11): 1324-1327. (in Chinese) |
[1] MIL-PRF-32070, Performance specification test program sets [S] [2] HB 7784-2005, 飞机地面自动测试设备测试程序集通用技术要求 [S] HB 7784-2005, General requirement of ground automatic test equipment for aircraft[S](in Chinese) [3] Gordon R S, Milton H H. Army test program set procedures .Headquarters Department of the Army Washington, DC 1992 . http:www.army.mil [4] Scully J K. Internal/external test harmonization, verticality and performance metrics-a systems approach Autotestcon Proceedings. Anaheim:IEEE, 1994:71-76 [5] Wright R G, Dudey Y, Bowers H, et al. Intelligent test program evaluation Autotestcon Proceedings.San Antonio, Texas:IEEE, 1990:71-75 [6] Anderson J L, Figuerres, Z E, Hovakemian A. Using ATE simulation to develop test procedures and verify testability for the STANDARD missile Aototestcon Proceedings. Salt Lake City, Utah:IEEE, 1998:28-34 [7] Dearborn W R, Perkins E G, Wong J J, Rolince D. The Virtual Test program (VTest) Autotestcon Proceedings. Salt Lake City, Utah:IEEE, 1998:149-159 [8] Dearborn W R, Perkins E G, Wong J J, et al. VTest system overview Autotestcon Proceedings. Anaheim, California:IEEE, 1997:52-59 [9] Dempster A. Upper and lower probabilities induced by a multivalued mapping[J]. Annals of Mathematical Statistics:IEEE, 1976,38:325-339 [10] Shafer G. A mathematical theory of evidence[M]. New Jersey:Princeton University Press, 1976 [11] IEEE Std 1226-1998, IEEE trial-use standard for a broad-based environment for test(ABBET) [S] [12] 田仲, 石君友.系统测试性设计分析与验证 [M].北京:北京航空航天大学出版社,2003:28-40 Tian Zhong, Shi Junyou. System testability design and verification[M]. Beijing:Beihang University Press, 2003:28-40(in Chinese) [13] MIL-STD-471A, Maintainability verificatin/demonstration/evaluation [S] [14] 秦孝英, 徐维新.可靠性数学基础 [M].北京:电子工业出版社,1988:310-313 Qin Xiaoying, Xu Weixin. The mathematical basis of reliability [M]. Beijing:Publishing House of Electronics Industry, 1988:310-313(in Chinese)
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