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掺杂nc-Si:H薄膜中纳米硅晶粒的择优生长

韦文生 王天民 张春熹 李国华

韦文生, 王天民, 张春熹, 等 . 掺杂nc-Si:H薄膜中纳米硅晶粒的择优生长[J]. 北京航空航天大学学报, 2003, 29(9): 753-758.
引用本文: 韦文生, 王天民, 张春熹, 等 . 掺杂nc-Si:H薄膜中纳米硅晶粒的择优生长[J]. 北京航空航天大学学报, 2003, 29(9): 753-758.
Wei Wensheng, Wang Tianmin, Zhang Chunxi, et al. Preferred growth of nanosized crystal silicon in doped hydrogenated nanocrystalline silicon film[J]. Journal of Beijing University of Aeronautics and Astronautics, 2003, 29(9): 753-758. (in Chinese)
Citation: Wei Wensheng, Wang Tianmin, Zhang Chunxi, et al. Preferred growth of nanosized crystal silicon in doped hydrogenated nanocrystalline silicon film[J]. Journal of Beijing University of Aeronautics and Astronautics, 2003, 29(9): 753-758. (in Chinese)

掺杂nc-Si:H薄膜中纳米硅晶粒的择优生长

基金项目: 863计划资助项目; 高校博士点基金资助项目(200220006037)
详细信息
    作者简介:

    韦文生(1966-),男,广西平乐人,博士生, weiwensheng287@sohu.com.

  • 中图分类号: O 613.72; O 613.8+1; O 613.62

Preferred growth of nanosized crystal silicon in doped hydrogenated nanocrystalline silicon film

  • 摘要: 发现PECVD生长的系列掺杂氢化纳米硅(nc-Si:H)薄膜中纳米硅晶粒(nc-Si)有择优生长的趋势.用Raman、XRD、AFM、HRTEM等方法研究其微观结构时发现:掺磷的nc-Si:H薄膜XRD 峰位的二倍衍射角约为33°.掺硼nc-Si:H薄膜的XRD峰位的二倍衍射角约为47°.用自由能密度与序参量的关系结合实验参数分析得到:较高的衬底温度引起序参量改变,使掺磷nc-Si:H薄膜中nc-Si的晶面择优生长.适当的电场作用引起序参量改变,导致掺硼nc-Si:H薄膜在一定的自由能密度范围内nc-Si的晶面择优生长.

     

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出版历程
  • 收稿日期:  2002-07-16
  • 网络出版日期:  2003-09-30

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