Fretting wear test and performance degradation model of electrical connector under step random vibration
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摘要:
针对电连接器工作时受步进随机振动作用,产生微动磨损而接触性能降低的问题,开展步进应力随机振动试验,采用电容层析成像(ECT)技术检测微动磨损过程中电连接器接触件间磨屑特征值,通过接触电阻与磨屑特征值研究步进应力随机振动条件下接触件的磨损程度及接触性能的退化规律。引入具有鲁棒性好、可以表征非线性关系的最大互信息系数(MIC)进行磨屑特征值与接触电阻的相关性分析,通过MIC筛选降维以提高模型预测精度。结果表明:步进应力随机振动下磨屑特征值、磨屑特征值总量和接触电阻均呈阶梯状变化趋势;通过MIC计算发现磨屑特征值总量与接触电阻强相关;能谱分析的结果与试验结果相吻合;采用MIC筛选优化的CHIO-Elman的性能退化模型的平均绝对误差百分比小于4%。
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关键词:
- 电连接器 /
- 电容层析成像 /
- 微动磨损 /
- 最大互信息系数 /
- 冠状病毒群体免疫优化算法
Abstract:In view of the problem that the electrical connector is subjected to step stress random vibration during operation, which leads to fretting wear of the electrical connector and the reduction of contact performance, the step stress random vibration test is carried out. The electrical capacitance tomography (ECT) is used to detect the characteristic value of wear debris between the electrical connector contacts in the process of fretting wear. Contact resistivity and the characteristic value of wear debris are used to study the wear degree and degradation law of contact performance under step stress random vibration conditions. The maximal information coefficient (MIC), which has good robustness and can characterize the nonlinear relationship, is introduced to analyze the correlation between the characteristic value of wear debris and contact resistance, and the dimension is reduced through mic screening to improve the prediction accuracy of the model. The findings demonstrate that under the random vibration of step stress, there is a stepped change trend in the contact resistance, the total characteristic values of wear debris, and the characteristic values of wear debris. Through the calculation of the maximum information coefficient, it is found that the total amount of wear debris characteristics is strongly correlated with the contact resistance. The results of energy spectrum analysis are consistent with the test results. The average absolute error of CHIO-Elman neural network performance degradation model optimized by MIC screening is less than 4%.
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表 1 电连接器接触件试品部分基本性能参数
Table 1. Electrical connector contacts specimen part basic performance parameters
额定
电压/V额定
电流/A工作
电压/V耐电
压/V接触
电阻/mΩ绝缘
阻抗/MΩ500 80 600 3000 0.2 2000 表 2 试验方案
Table 2. Test plan
试验
组别应力水平/
(g2·Hz−1)振动
方向试验
时间/min试品
编号1 0.04→0.06→0.08→0.10 x 800 x-1,x-2 2 0.04→0.06→0.08→0.10 y 800 y-1,y-2 3 0.04→0.06→0.08→0.10 z 800 z-1,z-2 表 3 各子区域的MIC计算结果
Table 3. Results of MIC calculations by sub region
试品
编号MIC(R, ΣΔC) 区域A 区域B 上层区域 下层区域 全部区域 x-1 0.51 0.62 0.45 0.68 0.88 x-2 0.53 0.51 0.39 0.65 0.66 y-1 0.47 0.50 0.45 0.52 0.85 y-2 0.39 0.40 0.36 0.44 0.44 z-1 0.59 0.51 0.52 0.58 0.71 z-2 0.53 0.63 0.56 0.60 0.78 表 4 试品y-1能谱分析各位置元素含量
Table 4. Analysis of element content at each position by specimen y-1 energy spectrum
编号
位置质量百分比/% 原子百分比/% O C Ni Cu Au O C Ni Cu Au 1 17.7 61.1 2.2 11.6 47.4 44.2 1.4 2.5 2 2 80.6 2.5 11.9 7.7 83.5 2.4 3.6 3 30.2 55.2 2.7 8.9 63.7 31.7 1.4 1.5 4 1.3 79.4 2.2 14.3 5.1 85.4 2.2 4.5 5 3.6 57.2 2.1 36.2 15.8 68.5 2.3 12.9 6 33 33 56 1.7 6.8 70.6 70.6 24.4 0.7 0.8 7 1.6 68.9 3 25.7 7 80.5 3.3 8.9 表 5 不同模型误差比较
Table 5. Comparison of errors between different models
模型 振动方向 E1 E2 E3/% Elman x 0.0111 0.0143 4.62 y 0.0224 0.0297 10.039 z 0.0131 0.0148 5.12 CHIO-Elman x 0.0063 0.0073 2.4121 y 0.0129 0.0146 5.0547 z 0.0082 0.0102 3.5003 MIC-CHIO-Elman x 0.0035 0.0168 1.7141 y 0.0076 0.0094 3.2525 z 0.0044 0.0049 2.0528 -
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