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基于EMD-LSTM的开关电源退化预测方法

张润芝 蔡宜伦 王兴坚 贺文博 徐嘉 贾汝钧

张润芝,蔡宜伦,王兴坚,等. 基于EMD-LSTM的开关电源退化预测方法[J]. 北京航空航天大学学报,2026,52(8):2943-2952
引用本文: 张润芝,蔡宜伦,王兴坚,等. 基于EMD-LSTM的开关电源退化预测方法[J]. 北京航空航天大学学报,2026,52(8):2943-2952
Zhang R Z,Cai Y L,Wang X J,et al. Degradation prediction method of switching power supply based on EMD-LSTM[J]. Journal of Beijing University of Aeronautics and Astronautics,2026,52(8):2943-2952 (in Chinese)
Citation: Zhang R Z,Cai Y L,Wang X J,et al. Degradation prediction method of switching power supply based on EMD-LSTM[J]. Journal of Beijing University of Aeronautics and Astronautics,2026,52(8):2943-2952 (in Chinese)

基于EMD-LSTM的开关电源退化预测方法

doi: 10.13700/j.bh.1001-5965.2025.0872
详细信息
    通讯作者:

    E-mail:wangxj@buaa.edu.cn

  • 中图分类号: V438+.4;TP802+.1

Degradation prediction method of switching power supply based on EMD-LSTM

More Information
  • 摘要:

    开关电源作为现代机电设备中重要的提供能量设备,对其健康状态进行实时的监测与评估,是保障系统高效运行的关键。针对传统基于物理模型和基于机器学习方法在复杂非平稳退化信号预测中的局限性,提出一种结合经验模态分解(EMD)与长短时记忆网络(LSTM)的混合模型对开关电源的退化信号展开预测的方法。该方法通过EMD对开关电源退化信号进行多尺度分解,通过对提取各个有效特征分量继续进行处理与筛选,利用LSTM捕捉时间序列中的长期依赖与非线性演化规律,从而实现对开关电源性能退化趋势的高精度预测,为寿命评估与可靠性保障提供了有效途径。为验证所提方法的有效性,设计并开发了开关电源退化模拟试验台,通过设计故障注入电路模拟开关电源中滤波模块中电容退化情况、完成开关电源关键元件退化的模拟。在退化实验中完成了对所提方法有效性的验证。

     

  • 图 1  开关电源系统结构

    Figure 1.  Structure of switch-mode power supply system

    图 2  电容器件结构组成

    Figure 2.  Structural composition of capacitor device

    图 3  电容器件等效模型

    Figure 3.  Equivalent circuit model of capacitor device

    图 4  本文方法流程

    Figure 4.  Flow of the proposed method

    图 5  EMD流程图

    Figure 5.  Flowchart of EMD

    图 6  LSTM基本单元

    Figure 6.  Basic unit of LSTM

    图 7  实验台结构

    Figure 7.  Structure of experimental test bench

    图 8  故障注入电路设计

    Figure 8.  Design of fault injection circuit

    图 9  整流滤波电容正常退化实验数据

    Figure 9.  Degradation experiment of rectifier filter capacitor

    图 10  整流滤波电容退化实验EMD结果

    Figure 10.  EMD results of rectifier filter capacitor degradation experiment

    图 11  整流滤波电容退化实验预测结果

    Figure 11.  Prediction results of rectifier filter capacitor degradation experiment

    图 12  3种结果在6组实验下对比结果

    Figure 12.  Comparison results of three results across six experimental groups

    表  1  退化注入实验条件

    Table  1.   Experimental conditions for degradation injection

    电源故障电容种类 初始容值/$ \text{μF} $ 组别 额定电压/ V 退化注入电压/ V 设置温度/℃
    整流滤波电容 1000 正常 28 28 25
    过压 28 35 25
    高温 28 28 75
    LC滤波电容 470 正常 28 28 25
    过压 28 35 25
    高温 28 28 75
    下载: 导出CSV

    表  2  预测结果对比结果统计

    Table  2.   Statistical comparison of prediction and actual results

    实验组别 方法 $ {E}_{\text{RMSE}} $ $ {E}_{\text{MAE}} $ R2
    第1组 EMD-LSTM 0.0203 0.0156 0.9882
    Transformer 0.0246 0.0235 0.9278
    LSTM 0.0437 0.0412 0.9217
    第2组 EMD-LSTM 0.0226 0.0199 0.9875
    Transformer 0.0396 0.0269 0.9373
    LSTM 0.1294 0.0238 0.9348
    第3组 EMD-LSTM 0.0417 0.0158 0.9896
    Transformer 0.0471 0.0171 0.9592
    LSTM 0.0687 0.0221 0.9218
    第4组 EMD-LSTM 0.0238 0.0164 0.9851
    Transformer 0.0654 0.0545 0.9559
    LSTM 0.0745 0.0742 0.9765
    第5组 EMD-LSTM 0.0752 0.017 0.9852
    Transformer 0.0874 0.0378 0.9650
    LSTM 0.1454 0.0543 0.9562
    第6组 EMD-LSTM 0.0304 0.0214 0.9753
    Transformer 0.0676 0.0654 0.9713
    LSTM 0.0656 0.0565 0.9504
    下载: 导出CSV
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出版历程
  • 收稿日期:  2025-12-23
  • 录用日期:  2026-03-08
  • 网络出版日期:  2026-04-13
  • 整期出版日期:  2026-08-31

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