General-utility testing path model of switches for ATE and application
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摘要: 针对自动测试设备(ATE)测试程序开发中的开关资源测试路径搜索复杂、冲突判断困难、管理难度大等问题,提出了通用ATE开关资源测试路径模型,给出了模型的构造方法和多开关资源级联的级联算法,介绍了模型的具体应用.模型实现了ATE测试过程中开关资源测试路径冲突判断、最佳测试路径自动搜索、测试路径故障隔离、测试程序与具体测试路径硬件资源无关.提高了测试程序(TP)的通用性和可移植性,降低了TP开发的工作量.Abstract: In order to solve the questions such as searching testing path, judging testing path conflict and managing testing path of switches during the course of programming testing programs (TP) of automation testing equipment (ATE), a general-utility testing path model of switches was brought forward, the model general description and interlink algorithm for much more switches connecting were presented, and the material application methods of the model was introduced. The automated searching of optimum testing path and judging of testing path conflict are realized, the fault of testing path can be isolated well and TP are not related to the material path hardware by the model means. Accordingly the general-utility and replantability of TP are improved, and the workload of programming TP is reduced.
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Key words:
- automation testing equipment /
- testing path /
- switches /
- optimization /
- path conflict
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[1] Orlet J L, Murdock G L. NxTest augments legacy military ATE [J] Aerospace and Electronic Systems Magazine, IEEE ,2002, 17:17~20 [2] Ramachandran N, Oblad R P, Neag I A, et al. The role of a signal interface in supporting instrument interchangeability . In:Autotestcon Proceedings . Anaheim, 2000.403~416 [3] Gal S, Neag I A. A unified interface for signal-oriented control of instruments and switches . In:Autotestcon Proceedings . Huntsville,2002.337~350 [4] Fertitta K, Eriksson D. The state of interchangeability in ATE . In:Autotestcon Proceedings . Anaheim,2000.417~424 [5] Stora M J, Droste D. "ATE open system platform" IEEE-P1552 structured architecture for test systems . In:IEEE Systems Readiness Technology Conference . Anaheim,2003.85~94
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