Discussion about seal test of electronics in GJB
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摘要: 通过理论分析论证了国家军用标准关于电子元器件密封性试验中存在的问题,提出了改进方案,为实现科学控制军品密封质量提供了参考依据.结合某厂密封性试验中细检漏的失效数据,说明国军标应对实验条件严格控制的必要性.Abstract: The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling theseal quality of military products scientifically. Failure data from a seal test processed by some factory are given to illustrate the importance of strictly controlling test conditions.
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Key words:
- sealing /
- reliability /
- leak rate /
- fine leak /
- GJB
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[1] GJB 548－88,微电子器件试验方法和程序[S]JB 548－88,Experiment method and process of microelectronics[S](in Chinese) [2] GJB 548A－96,微电子器件试验方法和程序[S]JB 548A－96,Experiment method and process of microelectronics[S](in Chinese) [3] MIL-STD-883E,METHOD 1014.9 SEAL[S] [4] 李根成.空空导弹系统可靠性试验现状及建议[J].军用标准化,2002,(1):46~48 Li Gencheng.Status in quo of reliability experiments for air-to-air missile system and some advices[J].Military Standardization,2002,(1):46~48(in Chinese) [5] 胡 燕.新时期我国军用电子元器件标准化工作的改革与实践[J].军用标准化,2002,(1):14~17 Hu Yan.Reformation and practice of standardization work for electronics in the new times[J].Military Standardization,2002,(1):14~17(in Chinese) [6] 刘玉岱.真空测量与检漏[M].北京:冶金工业出版社,1992 Liu Yudai.Vacuum-measurement and leak hunting[M].Beijing:Metalworking Industry Press,1992(in Chinese) -
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