基于机内测试的故障注入系统设计

张晓杰; 王晓峰; 金曼

基于机内测试的故障注入系统设计

1.
北京航空航天大学工程系统工程系, 北京 100083
2. 北京航空航天大学机械工程及自动化学院, 北京 100083

详细信息

作者简介:
张晓杰(1977-),男,山西阳泉人,硕士生, zxj-1@sohu.com.

中图分类号: V 240.2
计量
- 文章访问数: 3076
- HTML全文浏览量: 254
- PDF下载量: 1096
- 被引次数: 0
出版历程
- 收稿日期: 2005-04-18
- 网络出版日期: 2006-04-30

Fault injection system design based on BIT

1.
Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
2. School of Mechanical Engineering and Automation, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

摘要

摘要: 随着机内测试(Built-in Test, BIT)的深入研究和广泛应用,对其验证和评价提出了迫切要求,也使这一领域成为新的研究热点.通过故障注入的方式检测BIT性能是一种有效的验证其测试性水平的方法.在综合国内外相关研究的基础上,详细分析了BIT验证和评价的重要性、迫切性及其实用价值,着重阐述了关于BIT验证和评价的故障注入系统设计方案,并给出了系统实现的总体结构框图、工作流程图、系统中各子模块的关系图以及实验数据等.在硬/软件设计实现的基础上,进行了初步的BIT验证实验,模拟一定数量的故障注入到被测电路中,用以验证BIT测试的有效性.结果表明该故障注入系统能够满足验证BIT设计指标的要求,达到了预期的初步设计目的.
- 故障注入 /
- 故障诊断 /
- 测试性 /
- 机内测试
Abstract: With the deep research and comprehensive application of BIT(built-in test), exigent demands for the validation and estimate have been brought forward, and this field becomes a new focus on research. Testing the performance of BIT through fault-injection is an effective method to validate its testing level. Based on integrating the relevant domestic and foreign materials, the importance, imminence and practicality of the validation and evaluation of BIT have been analyzed in detail. The design and implementation of fault injection system have been particularly expatiated. Then the block diagram of gross structure, relation diagram of each mold in the system and working process chart of the system implementation have been presented. On the basis of the design and performance of hardware/software, primary experiment of BIT validation had been processed; a certain quantity of fault was injected into tested circuit in order to verify the validity. The result of experiment indicates that the system of fault-injection can suffice the request of BIT design.
- fault injection /
- fault diagnosis /
- testability /
- built-in test

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参考文献(1)

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