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随机粗糙面的双站散射模型分析

陈锟山 李召良 刘玉

陈锟山, 李召良, 刘玉等 . 随机粗糙面的双站散射模型分析[J]. 北京航空航天大学学报, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205
引用本文: 陈锟山, 李召良, 刘玉等 . 随机粗糙面的双站散射模型分析[J]. 北京航空航天大学学报, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205
CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)
Citation: CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)

随机粗糙面的双站散射模型分析

doi: 10.13700/j.bh.1001-5965.2015.0205
基金项目: 中国科学院遥感与数字地球研究所所长基金
详细信息
    通讯作者:

    陈锟山(1959-),男,中国台湾人,教授,chenks@radi.ac.cn,主要研究方向为微波遥感.

  • 中图分类号: O571.41+8

Model analysis of bistatic scattering from randomly rough surfaces

  • 摘要: 以先进积分方程模型(AIEM)为工作模型,从理论上系统分析了随机粗糙面的双站散射特征,探讨了不同粗糙程度下散射系数在方位平面上的谷点位置,并利用数值仿真模拟、实测值对理论预测的散射系数进行了说明与验证.结果显示,散射系数在方位向上的谷点位置与粗糙程度和极化特征密切相关.利用数值仿真模拟,可从物理的角度更系统深入地分析统计粗糙表面的散射特性,从而有利于设计以后的更有效的双站探测模式.

     

  • [1] Beckman P,Spizzichino A.The scattering of electromagnetic waves from rough surfaces[M].Oxford:Pergamon Press,1963:215-285.
    [2] Ulaby F T,Moore R K,Fung A K.Microwave remote sensing:Active and passive,Vol.II-radar remote sensing and surface scattering and emission theory[M].Norwood,MA:Artech House,1982:922-1025.
    [3] Fung A K.Microwave scattering and emission models and their applications[M].Norwood,MA:Artech House,1994:1-10.
    [4] Voronovich A G.Wave scattering from rough surfaces[M].Berlin:Springer-Verlag,1994:1-5.
    [5] Tsang L,Kong J A.Scattering of electromagnetic waves:Advanced topics[M].New York:John Wiley & Sons,2001:65-118.
    [6] Fung A K,Chen K S,Microwave scattering and emission models for users[M].Norwood,MA:Artech House,2009:1-6.
    [7] Fung A K,Li Q,Chen K S.Backscattering from a randomly rough dielectric surface[J].IEEE Transactions on Geoscience and Remote Sensing,1992,30(2):356-369.
    [8] Chen K S,Fung A K,Weissman D E.A backscattering model for sea surfaces[J].IEEE Transactions on Geoscience and Remote Sensing,1992,30(4):811-817.
    [9] Hsieh C Y,Fung A K,Nesti G,et al.A further study of the IEM surface scattering model[J].IEEE Transactions on Geoscience and Remote Sensing,1997,35:901-909.
    [10] Chen K S,Wu T D,Tsay M K,et al.A note on the multiple scattering in an IEM model[J].IEEE Transactions on Geoscience and Remote Sensing,2000,38(1):249-256.
    [11] Wu T D,Chen K S,Shi J C,et al.A transition model for the reflection coefficient in surface scattering[J].IEEE Transactions on Geoscience and Remote Sensing,2001,39(9):2040-2050.
    [12] Álvarez-Pérez J L.An extension of the IEM/IEMM surface scattering model[J].Waves in Random Media,2001,11(3):307-329.
    [13] Fung A K,Liu W Y,Chen K S,et al.An improved IEM model for bistatic scattering[J].Journal of Electromagnetic Wave and Applications,2002,16(5):689-702.
    [14] Chen K S,Wu T D,Tsang L,et al.Emission of rough surfaces calculated by the integral eq.method with comparison to three-dimensional moment method simulations[J].IEEE Transactions on Geoscience and Remote Sensing,2003,41(1):90-101.
    [15] Wu T D,Chen K S.A reappraisal of the validity of the IEM model for backscattering from rough surfaces[J].IEEE Transactions on Geoscience and Remote Sensing,2004,42(8):743-753.
    [16] Fung A K,Chen K S.An update on IEM surface backscattering model[J].IEEE Geoscience and Remote Sensing Letters,2004,1(2):75-77.
    [17] Du Y.A new bistatic model for electromagnetic scattering from randomly rough surfaces[J].Waves Random Complex Media,2008,18(1):109-128.
    [18] Wu T D,Chen K S,Shi J C,et al.A study of AIEM model for bistatic scattering from randomly surfaces[J].IEEE Transactions on Geoscience and Remote Sensing,2008,46(9):2584-2598.
    [19] Álvarez-Pérez J L.The IEM2M rough-surface scattering model for complex-permittivity scattering media[J].Waves in Random and Complex Media,2012,22(2):207-233.
    [20] Poggio A J,Miller E K.Computer techniques for electromagnetics[M].Oxford:Pergamon Press,1973:159-260.
    [21] Li Z,Fung A K.A Reformulation of the surface field integral equation[J].Journal of Electromagnetic Waves and Application,1991,5:195-203.
    [22] Ewe H T,Johnson J T,Chen K S.A comparison study of the surface scattering models and numerical model[C]∥IEEE International Geoscience and Remote Sensing Symposium.Piscataway,NJ:IEEE Press,2001:2692-2694.
    [23] Macelloni G M,Nesti G,Pampaloni P,et al.Experimental validation of surface scattering and emission models[J].IEEE Transitions on Geoscience and Remote Sensing,2000,38(1):459-469.
    [24] Yardim C,Johnson J T,Burkholder R J,et al.An intercomparison of models for predicting bistatic scattering from rough surfaces[C]∥Proceedings of IGARSS.Piscataway,NJ:IEEE Press,2015,in press.
    [25] Johnson J T,Ouellette J D.Polarization features in bistatic scattering from rough surfaces[J].IEEE Transactions on Geoscience and Remote Sensing,2014,52(3):1616-1626.
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出版历程
  • 收稿日期:  2015-04-09
  • 修回日期:  2015-05-05
  • 网络出版日期:  2015-10-20

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