Diagnostic strategy building method based on MDP
-
摘要: 针对传统方法忽略测试通过的不确定性因素,缺乏长周期寻优机制,难以在复杂测试系统中生成全局最优诊断策略的问题,提出了一种基于马尔可夫决策过程(MDP)的诊断策略构建方法。该方法将故障检测、隔离的过程表述为系统故障状态的马尔可夫过程,通过引入折扣因子与目标权重,构造了综合效用准则函数的无限折扣模型,并利用策略迭代算法求解出全局平稳最优诊断策略。实例表明,该方法充分考虑了测试通过的不确定性,可实现全局平稳策略寻优,能够有效地指导测试系统实现快速故障检测和隔离。
-
关键词:
- 诊断策略 /
- 马尔可夫决策过程(MDP) /
- 故障检测 /
- 策略迭代算法 /
- 策略优化
Abstract: Aiming at the problem that by the traditional method, it is difficult to get the global optimal diagnostic strategy of the complicated test system in fault detection for ignoring the uncertainty factors in the test execution and lacking of the long cycle optimization mechanism, a new diagnostic strategy building method based on Markov decision processes (MDP) is proposed. The process of fault detection and isolation is expressed as a Markov process; the unlimited discount model of the utility integrated criterion function is structured through the discount factor and objective weights; the global optimal diagnostic strategy is obtained with the policy iteration algorithm. The example shows that the test uncertainty factors are well considered, stable optimal strategy of overall situation can be achieved by this method, and the fast fault detection and isolation in the engineering practice can be guided effectively as well. -
[1] IEEE SCC20. IEEE trial-use standard for testability and diagnos ability characteristics and metrics:IEEE Std 1522-2004[S].Piscataway,NJ:IEEE Standards Press,2004:1-7. [2] 杨海马,于小强, 杨晖,等.漏泄电缆自动检测系统研究[J].电子测量与仪器学报,2014,28(7):795-797. YANG H M,YU X Q,YANG H,et al.Research on automatic detection system of leaky cable[J].Journal of Electronic Measurement and Instrumentation,2014,28(7):795-797(in Chinese). [3] PATTIPATI K R, ALEXANDRIDIS M.Application of heuristic search and information theory to sequential fault diagnosis[J].IEEE Transactions on System,Man,and Cybernetics,1990,20(4): 872-887. [4] SIMPSON W R, SHEPPARD J W.The multicriterion nature of diagnosis[C]//Proceedings of the IEEE Systems Readiness Technology Conference.Piscataway,NJ:IEEE Press,1993:389-395. [5] JOHNSON R A. An information theory approach to diagnosis[J].IRE Transactions on Reliability and Quality Control,1960,RQC-9(1):35. [6] 黎琼炜. 系统级BIT测试性设计技术及其在组合导航系统中的应用研究[D].长沙:国防科技大学,2001:34-57. LI Q W.Research on system level BIT design for testability technique and its application in integrated navigation system[D].Changsha:National University of Defense Technology,2001:34-57(in Chinese). [7] 景小宁,李全通, 陈云翔,等.基于信息熵的最少测试费用故障诊断策略[J].计算机应用,2005,25(2):417-419. JING X N,LI Q T,CHEN Y X,et al.Fault diagnosis strategy with least test cost based on information entropy[J].Journal of Computer Applications,2005,25(2):417-419(in Chinese). [8] TU F,PATTIPATI K R. Rollout strategy for sequential fault diagnosis[J].IEEE Transactions on Systems,Man and Cybernetics,2003,33(1):86-99. [9] 黄以锋,景博,喻彪, 等.基于概率阈的冗余多故障诊断策略[J].空军工程大学学报(自然科学版),2014,15(5):1-5. HUANG Y F,JING B,YU B,et al.Multiple fault diagnosis strategy for redundant system based on probability threshold[J].Journal of Air Force Engineering University (Natural Science Edition),2014,15(5):1-5(in Chinese). [10] 王红霞,叶晓慧, 田树新.基于广义AO*算法的测试序列问题研究[J].兵工学报,2010,31(2):204-209. WANG H X,YE X H,TIAN S X.Research on test sequencing problem based on generalized AO* algorithm[J].Acta Armamentarii,2010,31(2):204-209(in Chinese). [11] 邱静,刘冠军,杨鹏,等. 装备测试性建模与设计技术[M].北京:科学出版社,2012:316-319. QIU J,LIU G J,YANG P,et al.Equipment testability modeling and design technology[M].Beijing:Science Press,2012:316-319(in Chinese). [12] 黎洁,刘羽西, 李奇越.基于隐马尔可夫模型的认知无钱频谱切换方法[J].电子测量与仪器学报,2014,28(1):69-74. LI J,LIU Y X,LI Q Y.Spectrum handoff and method based on hidden Markov model in cognitive radio network[J].Journal of Electronic Measurement and Instrumentation,2014,28(1):69-74(in Chinese). [13] RUSSELL S, NORVING P.Artificial intelligence:A modern approach[M].Beijing:Tsinghua University Press,2011:645-658. [14] 刘克. 实用马尔可夫决策过程[M].北京:清华大学出版社,2004:34-45. LIU K.The utility of Markov decision processes[M].Beijing:Tsinghua University Press,2004:34-45(in Chinese). [15] 李行善,左毅,孙杰. 自动测试系统集成技术[M].北京:电子工业出版社,2004:66-70. LI X S,ZUO Y,SUN J.Automatic test system integration technology[M].Beijing:Publishing House of Electronics Industry,2004:66-70(in Chinese).
点击查看大图
计量
- 文章访问数: 761
- HTML全文浏览量: 51
- PDF下载量: 1498
- 被引次数: 0