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摘要:
弹用电磁继电器（EMR）是国防武器系统中重要的机电元件，负责信号传递、电路保护与控制、负载切换等功能，对弹用EMR贮存可靠性的可靠评估已成为亟待解决的问题。以装备应用普遍的某型弹用EMR为例，提出一种考虑性能退化的贮存可靠性试验和评价方法。通过研制的弹用EMR贮存退化试验综合系统，获得了其贮存退化敏感参数的变化情况，对弹用EMR的贮存可靠性建模方法进行了探索性研究。提出了基于时间序列分析和小波变换方法的实测参数预处理方法，提高了预测精度。通过回归理论估计了贮存退化模型的参数，并用所建模型对弹用EMR正常温度应力下的贮存寿命进行了预测。
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关键词:
- 电磁继电器(EMR) /
- 接触电阻 /
- 贮存可靠性 /
- 退化试验 /
- 自回归滑动平均(ARMA)模型 /
- 小波变换 /
- 寿命预测
Abstract:Missile electromagnetic relay (EMR) is one of the key electromechanical components used for signal transmission, load switching and circuit protection in defense weapon system. How to reliably evaluate the storage reliability of missile EMR has become the most important problem that is urgent to be solved. This study used missile EMR as research object. A new method for testing storage reliability is proposed by performance parameters degradation. The test and analysis system of missile EMR storage parameters was designed and developed. Based on the analysis of parameters changing in storage degradation testing, the modeling storage reliability method of missile EMR is extensively investigated. Prediction parameters preprocessing method is proposed which is based on time series analysis with wavelet transform method. And in this way, the prediction accuracy is increased. Parameters of the storage degradation model are estimated through the regression theory, and the storage life of missile EMR under normal stress is predicted.
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图 2 触点间表面腐蚀膜向心渗入示意图
A0-初始时刻的导电斑点平均直径；At-t时刻时导电斑点的平均直径。
Figure 2. Schematic of ingress inward of surface corrosion film in static contact
图 4 弹用电磁继电器贮存退化试验系统整体结构及照片
Figure 4. Major structure and photo of storage degradation testing system for missile EMR
图 5 不同温度下接触电阻退化量平均值的对比图
Figure 5. Comparison diagram of average degradation contact resistances at different temperatures
图 6 不同温度下接触电阻实测值的散点连线图
Figure 6. Scatter plots of real test data for contact resistances at different temperatures
图 8 不同温度应力下接触电阻的预处理结果
Figure 8. Results of pretreatment for contact resistances with different temperature stresses
图 9 不同温度应力下弹用电磁继电器贮存寿命预测曲线
Figure 9. Prediction curve of storage life for missile EMR with different temperature stresses
表 1 弹用电磁继电器相关部件耐热等级
Table 1. Heat-resistant levels of relevant components for missile EMR
部件名称 构成材料 耐热等级 底板绝缘垫片 6050聚酰亚胺薄膜 H级(180℃) 润滑垫片 6050聚酰亚胺薄膜 H级(180℃) 线圈挡板 聚四氟乙烯棒 C级(220℃) 线圈组漆包线 改良聚酯亚胺漆包线(E180) H级(180℃) 线圈组漆包线 聚酰亚胺漆包线(QY-1) C级(220℃) 
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表 2 加速退化试验条件
Table 2. Conditions of accelerated degradation test
参数 数值 试验温度应力/℃ 80，106，135，170 试样数量 每个温度取10支 测试频率/d 2 负载电流/mA 10(防止产生电弧破坏触点形貌) 其他要求 冷却至室温后再进行参数测试
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表 3 最优回归贮存退化模型函数备选库
Table 3. Alternative function library of the best storage regress degradation model
初始回归函数形式 变换过程 变换后的
线性回归方程线性函数: 
Y=α0+α1X1 指数函数: 
Y=α0+α1X1 幂函数: 
Y=α0+α1X1
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表 4 贮存试验样品的最优回归退化模型及贮存寿命预测结果
Table 4. Best regress degradation model and storage life prediction results for storage test samples
温度/℃ S值 最优回归
退化模型预测参数
失效阈值D/mΩ预测寿命
点估计TD/d区间估计
(TDX, TDS)/d线性函数 指数函数 幂函数 80 2.408 2.297 7.150 指数函数 50 6012 (5746, 6548) 106 0.315 0.259 4.677 指数函数 50 5424 (5356, 5566) 135 5.246 4.877 15.637 指数函数 50 4136 (3988, 4550) 170 0.219 0.099 21.712 指数函数 50 2234 (2218, 2242)
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表 5 弹用电磁继电器常温下的贮存寿命预测值
Table 5. Storage life prediction results of missile EMR in normal temperature stress levels
正常温度应力条件/℃ 25 32 45 贮存寿命预测值/d 16388 14531 11785
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