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基于多态系统的总线胚胎电子阵列可靠性分析

王涛 蔡金燕 孟亚峰 朱赛

王涛, 蔡金燕, 孟亚峰, 等 . 基于多态系统的总线胚胎电子阵列可靠性分析[J]. 北京航空航天大学学报, 2018, 44(3): 593-604. doi: 10.13700/j.bh.1001-5965.2017.0173
引用本文: 王涛, 蔡金燕, 孟亚峰, 等 . 基于多态系统的总线胚胎电子阵列可靠性分析[J]. 北京航空航天大学学报, 2018, 44(3): 593-604. doi: 10.13700/j.bh.1001-5965.2017.0173
WANG Tao, CAI Jinyan, MENG Yafeng, et al. Reliability analysis of bus-based embryonic electronic array based on multi-state system[J]. Journal of Beijing University of Aeronautics and Astronautics, 2018, 44(3): 593-604. doi: 10.13700/j.bh.1001-5965.2017.0173(in Chinese)
Citation: WANG Tao, CAI Jinyan, MENG Yafeng, et al. Reliability analysis of bus-based embryonic electronic array based on multi-state system[J]. Journal of Beijing University of Aeronautics and Astronautics, 2018, 44(3): 593-604. doi: 10.13700/j.bh.1001-5965.2017.0173(in Chinese)

基于多态系统的总线胚胎电子阵列可靠性分析

doi: 10.13700/j.bh.1001-5965.2017.0173
基金项目: 

国家自然科学基金 61372039

国家自然科学基金 61601495

详细信息
    作者简介:

    王涛 男, 博士研究生。主要研究方向:电子系统故障检测与自修复技术

    蔡金燕 女, 博士, 教授, 博士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复技术

    孟亚峰 男, 博士, 副教授, 硕士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复技术

    通讯作者:

    孟亚峰, E-mail: myfrad@163.com

  • 中图分类号: V243.1;TP302.7

Reliability analysis of bus-based embryonic electronic array based on multi-state system

Funds: 

National Natural Science Foundation of China 61372039

National Natural Science Foundation of China 61601495

More Information
  • 摘要:

    通过分析总线胚胎电子阵列(BBEEA)的结构特点和工作原理,将多态系统理论引入到阵列的可靠性分析中,采用通用生成函数(UGF)方法建立了阵列的可靠性分析模型。与基于n/k系统的阵列可靠性分析模型进行对比,验证了基于多态系统阵列可靠性分析模型的正确性和有效性。利用建立的阵列可靠性分析模型对总线胚胎电子阵列的可靠性进行分析,根据阵列的可靠性要求指导阵列的结构设计。同时,对比不同规模总线胚胎电子阵列与典型胚胎电子阵列(EEA)的可靠性,分析总线胚胎电子阵列的性能。分析结果表明:建立的阵列可靠性分析模型能够准确有效地分析阵列的可靠性,将阵列的可靠性分析与工作状态相结合,对阵列的结构设计和预防性维修决策具有重要的指导意义。

     

  • 图 1  总线胚胎电子阵列结构

    Figure 1.  Structure of bus-based embryonic electronic array

    图 2  功能模块结构

    Figure 2.  Structure of functional block

    图 3  循环移除故障自修复

    Figure 3.  Cyclic elimination fault self-repair

    图 4  2种可靠性分析模型下总线胚胎电子阵列的可靠度曲线

    Figure 4.  Reliability curve of BBEEA with two kindsof reliability analysis model

    图 5  功能模块内选择不同空闲细胞数目时总线胚胎电子阵列的可靠度曲线

    Figure 5.  Reliability curves of BBEEA with different numbers of spare cells chosen in functional block

    图 6  功能模块内选择不同空闲细胞数目时总线胚胎电子阵列的MTTF曲线

    Figure 6.  MTTF curve of BBEEA with different numbers of spare cells chosen in functional block

    图 7  功能模块内选择不同工作细胞数目时总线胚胎电子阵列的可靠度曲线

    Figure 7.  Reliability curves of BBEEA with different numbers of work cells chosen in functional block

    图 8  功能模块内选择不同工作细胞数目时总线胚胎电子阵列的MTTF曲线

    Figure 8.  MTTF curve of BBEEA with different numbers of work cells chosen in functional block

    图 9  不同规模行移除二维胚胎电子阵列的可靠度曲线

    Figure 9.  Reliability curves of different scales of two-dimensional EEA with row elimination

    图 10  不同规模循环移除总线胚胎电子阵列的可靠度曲线

    Figure 10.  Reliability curves of different scales of BBEEA with cyclic elimination

    图 11  不同规模细胞移除二维胚胎电子阵列的可靠度曲线

    Figure 11.  Reliability curves of different scales of two-dimensional EEA with cell elimination

    图 12  不同阵列结构、自修复方式和规模下阵列MTTF曲线

    Figure 12.  MTTF curves of array with different structures, self-repair strategies and scales

    表  1  功能模块的状态及概率

    Table  1.   States and probability of functional block

    状态 0 1 xj m-g+1
    概率 p0(t) p1(t) pxj(t) pm-g+1(t)
    下载: 导出CSV

    表  2  功能模块内选择不同空闲细胞数目时总线胚胎电子阵列的MTTF值

    Table  2.   MTTF of BBEEA with different numbers of spare cells chosen in functional block

    空闲细胞数目 2 4 5 6 7
    阵列的MTTF/h 4 967 9 455 12 251 15 667 20 160
    下载: 导出CSV

    表  3  功能模块内选择不同工作细胞数目时总线胚胎电子阵列的MTTF值

    Table  3.   MTTF of BBEEA with different numbers of work cells chosen in functional block

    工作细胞数目 1 2 3 4 6 12
    阵列的MTTF/h 18 359 15 667 13 870 12 558 10 734 7 921
    下载: 导出CSV

    表  4  不同阵列结构、自修复方式和规模下阵列MTTF值

    Table  4.   MTTF of array with different structures, self-repair strategies and scalesh

    104h
    阵列结构与自修复方式 工作细胞数目
    25 100 625 2 500 5 626 10 000
    循环移除总线胚胎电子阵列 31.459 19.248 10.905 7.342 7 5.874 3 5.027 6
    行移除二维胚胎电子阵列 12.666 5.517 6 2.010 3 0.972 55 0.641 13 0.478 13
    细胞移除二维胚胎电子阵列 12.666 5.517 6 2.010 3 0.972 55 0.641 13 0.478 13
    下载: 导出CSV

    表  5  t=5 000 h时总线胚胎电子阵列工作状态及概率

    Table  5.   Work states and probability of BBEEA at t=5 000 h

    状态 概率
    0 0.090 9
    1 0
    2 0.000 2
    3 0.000 3
    4 0.000 9
    5 0.000 2
    6 0.002 1
    8 0.003 2
    9 0.001 7
    10 0.001 4
    12 0.009 0
    15 0.002 3
    16 0.007 9
    18 0.008 8
    20 0.005 9
    24 0.023 0
    25 0.000 8
    27 0.004 4
    30 0.011 5
    32 0.013 5
    36 0.027 0
    40 0.014 5
    45 0.009 0
    48 0.040 0
    50 0.003 8
    54 0.013 1
    60 0.034 6
    64 0.016 5
    72 0.043 3
    75 0.006 1
    80 0.024 4
    81 0.004 3
    90 0.024 9
    96 0.043 1
    100 0.011 0
    108 0.025 0
    120 0.052 2
    128 0.012 9
    135 0.017 7
    144 0.043 6
    150 0.015 8
    160 0.024 6
    162 0.003 3
    180 0.046 2
    192 0.028 1
    200 0.015 6
    216 0.011 9
    225 0.011 9
    240 0.049 2
    250 0.003 3
    256 0.005 7
    270 0.006 8
    288 0.012 8
    300 0.028 4
    320 0.014 4
    324 0.001 0
    360 0.015 4
    375 0.005 4
    384 0.004 1
    400 0.013 7
    432 0.002 2
    450 0.004 6
    480 0.007 8
    500 0.005 8
    540 0.001 3
    576 0.001 3
    600 0.005 0
    625 0.000 9
    648 0.000 1
    720 0.001 4
    750 0.001 1
    864 0.000 1
    900 0.000 5
    1 080 0.000 1
    1 296 0
    下载: 导出CSV
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  • 收稿日期:  2017-03-23
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