Research on broadband and high flatness conductive electromagnetic susceptibility injection probe
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摘要:
集成电路和电子设备的小体积、高密度和高时钟频率的发展趋势，导致严重的电磁兼容问题，特别是电磁敏感性问题。集成电路和电子设备的电磁敏感性水平对其优化设计至关重要，而宽带脉冲注入探头广泛用于集成电路和电子设备的传导电磁敏感性测试。根据集成电路和电子设备的传导电磁敏感性测试需求，通过分析宽带脉冲注入探头的工作原理、影响工作带宽及平坦度的因素，进行宽频带高平坦度的宽带脉冲注入探头的方案设计，通过多线并绕、磁芯与外壳匹配设计、高频段阻抗匹配等方法，研制出宽频带高平坦度的宽带脉冲注入探头。测试结果和实际应用结果表明：所研制的宽带脉冲注入探头实现了工作频率覆盖9 kHz~1 GHz、平坦度小于5 dB的性能指标，可以满足开展传导电磁敏感性测试的需求。
Abstract:The development trend of small volume, high density, and high clock frequency of integrated circuits and electronic equipment leads to serious electromagnetic compatibility problems, especially electromagnetic susceptibility problems. The electromagnetic susceptibility level of integrated circuits and electronic equipment is very important for their optimal design, and broadband pulse injection probes are widely used in the conducted electromagnetic susceptibility test of integrated circuits and electronic equipment. The project design of broadband pulse injection probes with broadband and high flatness is put into effect by examining the operating principle of broadband pulse injection probes and the variables affecting working bandwidth and flatness on the basis of he conducted electromagnetic susceptibility test requirements of integrated circuits and electronic equipment. A broadband pulse injection probe with a broad frequency band and high flatness is produced using the techniques of multi-wire parallel winding, matching design of magnetic core and shell, and impedance matching in high-frequency band.The test results and practical application results show that the designed broadband pulse injection probe achieves the performance index of working frequency covering 9 kHz-1 GHz and flatness less than 5 dB, and can also meet the needs of conducting electromagnetic susceptibility tests.
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图 1 宽带脉冲注入探头进行传导电磁敏感性测试原理
Figure 1. Principle of a broadband pulse injection probe for conducted electromagnetic susceptibility testing
图 3 宽带脉冲注入探头连接回路示意图
Figure 3. Diagram of connection circuit of broadband pulse injection probe
图 4 宽带脉冲注入探头外层体组成及探头与校准夹具组合
Figure 4. Composition of outer layer of broadband pulse injection probe and combination of probe and calibration fixture
图 5 宽带脉冲注入探头校准夹具内外导体构成回路及电流流向
Figure 5. Broadband pulse injection probe calibration fixture circuit formation and current flow direction for conductors inside and outside fixture
图 6 宽带脉冲注入探头校准测试装置连接示意图
Figure 6. Broadband pulse injection probe calibration test set connection diagrams
图 7 宽带脉冲注入探头实际电路模型
Figure 7. Actual circuit model of a broadband pulse injection probe
图 8 宽带脉冲注入探头的具体设计流程
Figure 8. Specific design flow for broadband pulse injection probes
图 10 自主研制宽带脉冲注入探头S21参数测试装置图
Figure 10. Self-developed broadband pulse injection probe S21 parameter test set diagram
图 11 自主研制宽带脉冲注入探头S21参数测试
Figure 11. Self-developed broadband pulse injection probe S21 parameter test
图 12 自主研制宽带脉冲注入探头S21参数测试结果
Figure 12. Self-developed broadband pulse injection probe S21 parameter test result
图 13 美国FCC商业探头S21参数测试结果
Figure 13. U.S. FCC commercial probe S21 parameter test results
图 14 研制的探头进行传导电磁敏感性测试装置连接图
Figure 14. Connection diagram of the devices for conducting electromagnetic susceptibility testing with development probes
图 15 待测设备原始波形和注入干扰后各测试频点的波形变化
Figure 15. Changes in original waveform of the device to be tested and waveform at each test frequency point after interference injection
表 1 自主研制宽带脉冲注入探头与FCC商业探头性能对比
Table 1. Performance comparison of self-developed broadband pulse injection probes and FCC commercial probes
产品名称 型号 可用频率/MHz 平坦度/dB 额定功率/W 自主研
制探头BHEMC-
Pro
-1E9-010.009~1000 5 400
（瞬时
功率>1000）美国FCC
商业探头F-140 0.1~1000 7 100 
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