Software reliability growth model with S-shaped testing effort function
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摘要: 软件测试工作量随时间的变化情况对于软件可靠性增长曲线的形状具有显著影响,因此将测试工作量函数(TEF,Testing Effort Function)引入软件可靠性增长模型(SRGM,Software Reliability Growth Model)中以提高软件可靠性评估性能.分析了软件结构特征及学习因素对实际测试过程的综合影响,研究增长速率为先增后减的S型增长趋势的TEF,提出两种S型TEF,即延迟S型TEF与变形S型TEF,并提出考虑延迟S型TEF的SRGM(DSTEF-SRGM)以及变形S型TEF的SRGM(ISTEF-SRGM).在两组真实失效数据集上,进行了这两种SRGM与经典SRGM及其它考虑TEF的SRGM的对比研究.结果表明,ISTEF-SRGM的模型拟合效果最优,同时验证了该模型具有优越的软件可靠性评估性能及模型适应性.Abstract: The shape of the observed reliability growth curve depends strongly on the time distribution of the testing effort. Thus, the reliability estimation power of software reliability growth model (SRGM) can be improved by considering the testing effort function (TEF). Due to the integrated effects of software structure and learning factor on testing process, testing effort increasing rate may exhibit an S-shaped varying trend first increasing and then decreasing. To accurately describe this S-shaped varying trend, two S-shaped testing effort functions were proposed first, i.e. delayed S-shaped TEF and inflected S-shaped TEF, which were simple and flexible. Then two new SRGMs were put forward by combining two S-shaped TEFs into SRGM, i.e. DSTEF-SRGM and ISTEF-SRGM. Finally, for two real failure data-sets, the case study was done by comparing these two S-shaped TEF-SRGMs with several classical SRGMs and other representative SRGMs considering TEF in the form of estimation power. The result shows that compared with these comparison models, the proposed ISTEF-SRGM has the best fitting results on each data-set. In other words, the proposed ISTEF-SRGM provides novel applicability and a significantly better power of reliability estimation.
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Key words:
- software reliability /
- testing /
- reliability analysis /
- growth /
- models
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