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对数正态分布寿命型序贯验证试验方法

邓清 袁宏杰

邓清, 袁宏杰. 对数正态分布寿命型序贯验证试验方法[J]. 北京航空航天大学学报, 2012, 38(12): 1653-1656.
引用本文: 邓清, 袁宏杰. 对数正态分布寿命型序贯验证试验方法[J]. 北京航空航天大学学报, 2012, 38(12): 1653-1656.
Deng Qing, Yuan Hongjie. Sequential compliance test method for lognormal distribution[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, 38(12): 1653-1656. (in Chinese)
Citation: Deng Qing, Yuan Hongjie. Sequential compliance test method for lognormal distribution[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, 38(12): 1653-1656. (in Chinese)

对数正态分布寿命型序贯验证试验方法

详细信息
  • 中图分类号: TP 114.3

Sequential compliance test method for lognormal distribution

  • 摘要: 借鉴指数分布寿命型序贯验证试验方案的思想,讨论了以平均寿命为指标的对数正态分布寿命型产品序贯验证试验的制定方法,给出了序贯试验的试验程序,研究了截尾状态下序贯试验的生产方风险和使用方风险的上限.基于工程实际的抽样方法,给出了计算机仿真评价方法,对给出的序贯试验方案进行评价.评价结果表明,在样本量和截尾数满足要求的前提下,所提出的序贯验证试验方法能够满足对双方风险的控制要求,且对使用方风险提供了更大的保护.

     

  • [1] 陈文华,柴新,盛军鑫,等.Weibull寿命型产品可靠性定数截尾验证试验方法[J].浙江大学学报,2001,35(2):128-130 Chen Wenhua,Chai Xin,Sheng Junxin,et al.Demonstration test plans of reliability for Weibull distribution based on censored samples type II[J].Journal of Zhejiang University,2001,35(2):128-130(in Chinese)
    [2] 陈文华,柴新,石永刚.Weibull寿命型产品可靠性序贯验证试验方法[J].仪器仪表学报,1999,20(5):493-496 Chen Wenhua,Chai Xin,Shi Yonggang.Sequential compliance method for Weibull distributions[J].Chinese Journal of Scientific Instrument,1999,20(5):493-496(in Chinese)
    [3] Guo Bo,Jiang Ping,Xing Yunyan.A censored sequential posterior odd test (SPOT) method for verification of the mean time to repair[J].IEEE Transactions on Reliability,2008,57(2):243-247
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    [5] Lee Pei Hsi,Torng Chau Chen,Lin Yang Cheng.Determination of the optimal accelerated burn-in time under Arrhenius Lognormal distribution assumption[J].Applied Mathematical Modelling,2011,35:4023-4030
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出版历程
  • 收稿日期:  2011-08-03
  • 网络出版日期:  2012-12-30

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