基于多光谱测温优化的材料光谱发射率测量

杨永军; 王中宇; 张术坤; 张学聪

doi:10.13700/j.bh.1001-5965.2013.0504

基于多光谱测温优化的材料光谱发射率测量

doi: 10.13700/j.bh.1001-5965.2013.0504

1. 北京航空航天大学仪器科学与光电工程学院, 北京 100191;
2. 北京长城计量测试技术研究所, 北京 100095

详细信息

作者简介:
杨永军（1973-），男，河南林州人，高级工程师，yangyj007@sina.com.

中图分类号: TN215
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出版历程
- 收稿日期: 2013-08-28
- 网络出版日期: 2014-08-20

Material spectral emissivity measurement optimized by multi-spectral temperature measured

1. School of Instrumentation Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China;
2. Beijing Changcheng Institute of Metrology and Measurement, Beijing 100095, China

摘要

摘要: 针对高温材料红外光谱发射率测量中样品表面温度难以准确测量的问题，提出了直接使用光谱仪测量得出样品表面的光谱辐射能量信息，选取其中合适的光谱波段利用多光谱测温方法得到样品表面温度，进而计算出材料的光谱发射率.分析了多光谱测温中发射率模型的阶次和测量波段选取对测温准确度的影响，给出了温度计算的稳健算法，并对其主要不确定度的来源进行了评定.在1 100 K左右温度下以不锈钢材料进行实验验证，得出温度引起的光谱发射率相对不确定度在2～20 μm范围内低于2%，满足红外隐身和辐射测温等领域的要求，适合于导热性能差的材料或涂层材料的高温光谱发射率测量.
- 材料光谱发射率 /
- 能量比较法测量 /
- 多光谱测温 /
- 红外光谱仪 /
- 涂层材料
Abstract: The sample surface temperature is difficult to measure in the infrared spectral emissivity measurement of high-temperature material. Optimized temperature measurement method was proposed by multi-spectral method using the spectral radiation energy data measured by spectrometer. The effect of emissivity model and measuring band selected on the accuracy of temperature measurement was analyzed. A robust calculation algorithm was recommended, and its main sources of uncertainty were evaluated. To verify the effectivity of the method, a high temperature alloy material was tested at a temperature of about 1 100 K, and its spectral emissivity relative uncertainty is less than 2% within 2-20 μm spectral range. It shows that this optimized method meets the demand of infrared stealth and radiation thermometry, and can be applied in high temperature spectral emissivity measurement of poor thermal conductivity material or coating material.
- material spectral emissivity /
- energy comparative measurement /
- multi-spectral temperature measurement /
- infrared spectrometer /
- coating material

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参考文献(12)

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